Skip to content
daniel.ortiz@epfl.ch
Facebook page opens in new windowTwitter page opens in new windowYouTube page opens in new window
Open access EPFL Mass Spectrometry tools
Mass Spectrometry EPFL tools
Open access EPFL Mass Spectrometry toolsOpen access EPFL Mass Spectrometry tools
  • Home
  • Applications
    • Theoretical calculations
    • Peptides and Proteins
    • Oligonucleotides
    • Polymers
    • Complex mixtures of compounds
    • Custom Database / Contaminants
    • Mass spectra deconvolution
    • LC Visualization
  • News
  • Teaching
  • about us
  • References
  • Glossary
  • Contact
Search:
  • Home
  • Applications
    • Theoretical calculations
    • Peptides and Proteins
    • Oligonucleotides
    • Polymers
    • Complex mixtures of compounds
    • Custom Database / Contaminants
    • Mass spectra deconvolution
    • LC Visualization
  • News
  • Teaching
  • about us
  • References
  • Glossary
  • Contact

secondary ion mass spectrometry (SIMS)

You are here:
  1. Home
  2. Glossary Item
  3. secondary ion mass spectrometry (SIMS)
« Back to Glossary Index

Technique in which a focused beam of primary ions produces secondary ions by sputtering from a solid surface. The secondary ions are analyzed by mass spectrometry

« Back to Glossary Index
Share this post
TweetShare on Twitter Share on FacebookShare on Facebook Share on LinkedInShare on LinkedIn
Open access EPFL Mass Spectrometry tools
© MS Tools - EPFL- All rights reserved.
  • Inicio
  • Herramientas
    • Cálculos
    • Péptidos y Proteínas
    • Oligonucleótidos
    • Polímeros
    • Mezcla compleja de compuestos
    • Crea tu base de datos/contaminantes
  • News
  • Enseñanza
  • Equipo
    • Dr. Daniel Ortiz
    • Dr. Laure Menin
    • Francisco Sepulveda
    • Dr. Natalia Gasilova
    • Dr. Luc Patiny
  • Referencias
  • Glosario
  • Contacto
  • English
  • Español
Esp
Go to Top